Featured exhibitor: Ophir

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Hall A2, Booth 209

Automated Beam Profiling for Manufacturing

Measure critical beam parameters in industrial environments at high power levels with Ophir BeamWatch Integrated. The solution was developed for use in automated production lines and is based on Ophir’s non-contact laser measurement technology. BeamWatch Integrated accurately captures and analyses focal spot data of industrial lasers for wavelengths from 980 to 1,080nm. The system provides real-time measurements of focused laser beams with a power density that is too high for traditional measurement devices. Because there is no contact with the focused beam, there is no wear on the instrument, making it ideal for 24/7 use in production environments. Beam parameters measured include focus spot width and location, focal shift, centroid, M2, divergence, beam parameter product, Rayleigh length, beam tilt angle and absolute power.

  • Real-time measurement
  • Focal shift detection
  • Laser measurement during loading/unloading
  • Power meter with integrated Profinet interfaces
  • Limit values can be set to trigger actions
  • All parameters are analysed and stored

More information: 

www.ophiropt.com/photonics

Company: 

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