Ophir-Spiricon has released the latest version of its high power, scanning slit beam profiler, NanoScan 2s. Now available in a more compact size, NanoScan 2s is a NIST-calibrated profiler that measures beam position and size with sub-micron precision for CW and kilohertz pulsed lasers.
The profiler offers silicon, germanium, or pyroelectric detectors; this allows profiling lasers of any wavelength, from UV to far infrared and to 100μm. New NanoScan 2s software, available in standard and professional versions, allows users to custom configure the display interface.
The profiler uses moving slits – one of the ISO standard scanning aperture techniques – to measure beam sizes from micrometres to centimetres at beam powers from microwatt to kilowatt. The natural attenuation provided by the slit allows the measurement of many beams with little or no additional attenuation required.
The digital controller provides deep, 16-bit digitisation of the signal for high dynamic range up to 35dB power; this makes it possible to measure beam size and beam pointing with three-sigma precision to several hundred nanometres. The silicon or germanium detector-based profilers include an integrated 200mW power meter that displays both total power and individual power in each of the beams being measured.
NanoScan 2s software can measure from 1 to 16 beams in the aperture with sub-micron precision. A beam can be found in less than 0.3 seconds and real-time updates can be displayed to 20Hz.